Star Test Pattern
Star Test Pattern
High-Precision Star X-Ray Test Pattern, 55 mm Ø. For measuring focal spots from 0.1 to 0.3 mm. Has four 15° patterned sectors with a 0.5° angle of a single line within a sector. Lead-foil thickness: 0.03 mm
Star –Ray Test Patterns for Measuring Focal Size Star X-Ray Test Patterns for Measuring Focal Spot Size Focal spot size can be determined by observing the regions of blurring which occur when the pattern is Radio graphed by an x-ray source of finite dimensions. Radiation from different areas of the focal spot will cause a periodic blurring of the pattern due to penumbra effects. Knowledge of the geometric factors, and the distance from the center of the pattern to the region where blurring occurs, will permit the calculation of the focal spot size with the same accuracy as measurements made with a pinhole camera.
SKU | 106054 |
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MFR Number | 07-503-2000 |
Manufacturer | FLUKE ELECTRONICS CORPORATION |
UOM | EA |
Packaging | EACH |
BAAN SKU | 265938 |